Atomic Force Microscopy
نویسنده
چکیده
Scanning probe microscopy (SPM) has revolutionised high resolution imaging of a wide range of samples. With the introduction of atomic force microscopy (AFM) high resolution images can be obtained without the need for the sample to be placed in a vacuum chamber. Furthermore, modern AFM systems are capable of producing high quality images of samples immersed in a wide range of liquids. Atomic Force Microscopy
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